Near infrared Wavemeter in Polycrystalline Germanium on Silicon

G. Masini, L. Colace, and G. Assanto

Electron. Lett. 35, 1549-1551 (1999)


We introduce a novel solid state device for the spectral analysis of near infrared light. The device is an array of six photodetectors in polycrystalline Ge on Si, each element being wavelength selective. We describe the device fabrication, characterization and demonstration both as wavelength meter and as spectrum analyzer.